SiC & GaN
Find more about our Reliability, Burn-in and Testing solutions for SiC & GaN devices.
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ETNA MOSBTS-M180
The ETNA MOSBTS-M180 is focused on High Voltage and is the EDA solution for Burn-in on SiC and GaN devices and Power Modules.
Published in: Burn-in & Reliability Equipment -
ETNA Dynamic for DHTOL
The ETNA Dynamic DHTOL Solution allows the Customer to speed up the reliability assessment of GaN devices, supporting their successful introduction in technologically advanced fields: from Automotive to Industrial as well as…
Published in: Burn-in & Reliability Equipment -
ETNA Dynamic for DGS/DRB
The ETNA Dynamic Solution for DGS/DRB trials allows the Customer to evaluate reliability and robustness of the Gate under dynamic stress conditions in accordance with AQG324 Standard. These tests are crucial because…
Published in: Burn-in & Reliability Equipment -
SocrATE/AWL-BITS MOSBTS-M180
The SocrATE equipment, known also as AWL-BITS MOSBTS-M180, is our breakthrough solution for Wafer Level Burn-in on WBG devices.
Published in: Wafer Level Burn-in -
ERIS Thermal Platform
The ERIS equipment is our single-chamber solution, which can be factory-configured to run Hot&Cold, THB, H3TRB, HTRB and DH3TRB tests, resulting in different thermal and environmental system specification.
Published in: Burn-in & Reliability Equipment -
ERIS for H3TRB/HTRB
By exploiting the interaction between high voltage and high temperature humidity, this ERIS solution for H3TRB/HTRB helps to highlight failure modes that are making these trials increasingly important in assessing the reliability…
Published in: Burn-in & Reliability Equipment -
ERIS for DH3TRB
The ERIS solution for DH3TRB trials is key to ensuring that SiC devices can operate reliably in harsh environments and for long periods, reducing the risk of failure and improving the safety…
Published in: Burn-in & Reliability Equipment -
QM48 MOSBTS-M152
The QM48 MOSBTS-M152 solution is our Burn-in equipment specifically designed for SiC & GaN devices and Power Modules. The system is equipped with 4 independent chambers with 12 BiB slots each.
Published in: Burn-in & Reliability Equipment -
Thermal Cycler 1200E-HC
The Thermal Cycler 1200E-HC is our consolidated temperature stress platform with high thermal performance. The robustness of the system and the ease of monitoring and management provided by the chamber synoptic platform have…
Published in: Burn-in & Reliability Equipment -
MOSBTS-M Test Platform
The MOSBTS-M is our Burn-in & Reliability Test Platform for SiC & GaN devices and Power Modules. Designed both for Front-End and Back-End environment, it enables many different test executions, such as…
Published in: Test Electronics