EDA Industries is a leader in Package Level Burn-in & Reliability Test Equipment for the semiconductor industry.
The ETNA solution summarizes 30 years of experience, being the ideal platform to carry out R&D, Q&R and production tests for the main families of devices, included SiC & GaN, Power Modules, SoC, MEMS and Memories.
The ETNA VBTS-M is our Burn-in and Reliability Equipment focused on SoC, Analog, Digital & Mixed Signal, Microprocessors, MEMS, Memories and High Power devices.
This is the right choice to perform HTOL, PTC, IOL and LTOL test trials.
Main features
Test platform reprogrammable Microprocessor and FPGA firmwares
- Software reconfiguration of the same Hardware platform as a Digital, Mixed-Signal and Memory tester
- Continuous development of new features and upgrades, that can be easily updated just by deploying a Firmware release
- Advanced modularity for an easy system configuration and improved maintenability
Leakage Measurement Capability
- Drift monitoring to predict device failure
- Technology learning curve optimization
State-of-the-art thermal platform
- Industry 4.0 Compliant
- Green solution
- Automation ready
- Hot-Cold configuration for Reliability characterization activities
Data Analysis SW Tool
- Real Time monitoring enabling Burn-in Adaptive Strategy
- Post processing analysis for feedback to R&D, Product Quality and Reliability, Manufacturing
Test platform main features
- Total signals per BIB: Up to 336 (368 for Memories Test Platform)
- Number of I/O bidirectional lines: Up to 256
- Number of stimulation lines: Up to 48
- Number of additional input lines: Up to 32
- Number of expansion lines for optional boards: Up to 32
- Total BIB Connector Pins: 480 edge finger + 44 power
- Number of DUT Power Supply Units: Up to 6
- Maximum total power per BIB: 600 W
- Maximum total current per BIB: 104 A
- Number of VREF for DUT Voltage References: 4
VBTS-M Test Platform additional options
- Analog Waveform Generator board, adding 4 differential Analog channels.
- Analog Monitoring board, replacing 128 IOs with 96 Analog Input lines.
- High Power option, bringing additional 16 High Power Supplies dedicated for DUTs’ supply, powering each BIB with more than 2KW and 640A.
- DUT TEMP MON option for Single Device Temperature Monitoring, fully embedded in the EDA system.
- Single-Device Temperature Control option, fully embedded in the EDA system.
- Parametric Measurement option, adding PMU capability to every line and power supply.
- Enhanced option for advanced Quality and Reliability Test, bringing arbitrary waveform generation, advanced analog monitoring, and a 5KW external power supply control with 24 EXT-PSU lines for independent voltage and current monitoring.
- Enhanced option for Power/Load architecture, bringing an additional 5/10KW External Power Supply to test devices that require external fixed or programmable load.
Thermal platform main features
- Number of Chambers/Equipment: 2
- BIB slots: 24 (12 for each chamber)
- Max Temperature range: from -55°C up to 200°C
- BIB insertion/extraction: Automatic, at slot level
- Chamber doors opening: Automatic. Sliding doors with inflatable gasket
- Temperature Setting Resolution: 0,1°C
- Temperature Setting Accuracy: ±1°C
- Temperature Uniformity: ±3°C (Valid in the range [-45; 150]°C @max. heat dissipation, with 12 Bibs loaded. Measurement points at 100 mm offset from chamber wall and 10 mm close to DUT)
- Max Dissipation @150°C per Chamber: 5KW /7,5 KW
- Max Dissipation @-45°C per Chamber: 2,5KW / 3,5 KW
- Condensation: Water
- N2 Management Option: Available
Software platform main features
The system’s Software Test Environment provides the complete set of tools for Test development (SW Development package), Production execution and Reporting (SW Execution package).
With its rich set of graphical user interface, the ETNA VBTS-M software offers the engineering tools necessary to characterize devices, as well as develop and debug test programs quickly and efficiently.
Pattern Editor
- New IDE for pattern viewer and editor based on EDA platform vectors
- Easy Test program generation
Test Plan Editor
- Features for easier engineering activities
- Easier operator interface
Data Viewer
- Powerful data reporting and analysis, which includes dedicated Burn-in data format and STDF output
- Run-time access to test-flow steps, parameters and measures
- Detailed report on the analyzed data
Contact us
In addition to the significant existing products’ portfolio, EDA Industries is specialized in meeting specific customer requests by customizing its solutions or by designing new ones.
For further info, please send a direct request to sales@eda-industries.com