SiC & GaN
Find more about our Reliability, Burn-in and Testing solutions for SiC & GaN devices.
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PBTS

PBTS stays for Pre-Burn-in Test Station and it is meant to be used for Burn-in Boards verification before the Burn-in.
Published in: Test StationsTechnologies: SiC & GaN, Power Modules, Microprocessors, Analog, Digital & Mixed Signal, High Power, MEMS, Memories -
ETS

ETS stays for Engineering Test Station and it is meant to be used for activities like Application Development, Burn-in Boards design debug and Test program verification.
Published in: Test StationsTechnologies: SiC & GaN, Power Modules, Microprocessors, Analog, Digital & Mixed Signal, High Power, MEMS, Memories -
EDA Burn-in Boards

In addition to the following Burn-in Boards portfolio, we are specialized in meeting specific customer requests, by customizing our solutions or by designing new ones.
Published in: Burn-in BoardsTechnologies: SiC & GaN, Power Modules, Microprocessors, Analog, Digital & Mixed Signal, High Power, MEMS, Memories, Electronic Modules -
EDA Operating System Software

The EDA Operating System Software, available with the same characteristics both for Wafer and Package Level, provides the complete set of tools for Test Development (SW Development package), Production execution and Reporting…
Published in: Software Platforms & Data Analysis ToolTechnologies: SiC & GaN, Power Modules, Microprocessors, Analog, Digital & Mixed Signal, High Power, MEMS, Memories, Electronic Modules -
EDA Thule

The EDA Thule is our powerful and multipurpose Data Analysis Software, which can be embedded in both EDA Wafer and Package Level Equipment.
Published in: Software Platforms & Data Analysis ToolTechnologies: SiC & GaN, Power Modules, Microprocessors, Analog, Digital & Mixed Signal, High Power, MEMS, Memories, Electronic Modules
