The market demand for high voltage WLBI systems, especially for SiC and GaN, is growing rapidly.
In this context, EDA Industries has decided to invest further in this sector, building on the success of the first supplies of EDA systems and motivated by the forthcoming evaluation of the WLBI system by other important top players in the market.
The Wafer Level Burn-In, in addition to the well consolidated Burn-in and Package Testing system, provides SiC and GaN manufacturers with seamlessly integrated solutions to meet stress testing needs at both the front-end and back-end levels. Data correlation is ensured by equivalent architectures and managed by an advanced data analysis SW.
EDA Completed the RBA Validated Audit Process, achieving GOLD Status.
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Test Insight, a world leader in software tools for linking design to test and managing ATE programs, announced today that EDA Industries , has adopted ATEGen to Translating STIL/WGL into EDA Industries tester format.
ATEGen provides Direct conversion from cycle driven simulation data (ATPG scan patterns) (WGL/TDL/STIL) to tester.
“Fast and efficient conversions of patterns allows a smooth test creation flow andsaves EDA customers engineering time and conversion turn-around time,” according to Emiliano Polpetta , System Business Unit Manager.
"EDA has an excellent reputation for innovation and quality and we are delighted that they have chosen Test Insight solutions as a partner" said Etay Bransky Director of Sales at Test Insight, " ATEGen's high performance saves a lot of time - especially on large design files.