{"id":1805,"date":"2025-03-26T10:52:52","date_gmt":"2025-03-26T09:52:52","guid":{"rendered":"https:\/\/www.eda-industries.net\/?post_type=products&#038;p=1805"},"modified":"2025-12-16T14:56:43","modified_gmt":"2025-12-16T13:56:43","slug":"etna-dynamic-dhtol","status":"publish","type":"products","link":"https:\/\/www.eda-industries.net\/en\/products-and-technologies\/etna-dynamic-dhtol\/","title":{"rendered":"ETNA Dynamic for DHTOL"},"content":{"rendered":"\n<p class=\"wp-block-paragraph\">EDA Industries is a leader in Package Level Burn-in &amp; Reliability Test Equipment for the semiconductor industry.&nbsp;<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">The ETNA solution summarizes 30 years of experience, being the ideal platform to carry out R&amp;D, Q&amp;R and production tests for the main families of devices, included SiC &amp; GaN, Power Modules, SoC, MEMS and Memories.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">The <strong>ETNA Dynamic DHTOL Solution<\/strong> allows the Customer to speed up the reliability assessment of GaN devices, supporting their successful introduction in technologically advanced fields: from Automotive to Industrial as well as TLC and Aerospace ones.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\"><mark style=\"background-color:rgba(0, 0, 0, 0)\" class=\"has-inline-color has-accent-2-color\">Main features&nbsp;<\/mark><\/h3>\n\n\n\n<h5 class=\"wp-block-heading\">Versatile Test Platform allowing compatibility with most important Reliability Test Standard<\/h5>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Compatibility with JEP173 and JEP180 Standard for DHTOL on GaN Devices<\/li>\n\n\n\n<li>Compatibility with AECQ100 Test Standard for HTOL and PTC Reliability Test Standard<\/li>\n<\/ul>\n\n\n\n<h5 class=\"wp-block-heading\">State-of-the-art thermal platform&nbsp;<\/h5>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Industry 4.0 Compliant&nbsp;<\/li>\n\n\n\n<li>Green solution&nbsp;<\/li>\n\n\n\n<li>Automation ready&nbsp;<\/li>\n\n\n\n<li>Maximum flexibility, allowing different test configuration mixing (i.e., Static on Oven 1, Dynamic on Oven 2)<\/li>\n<\/ul>\n\n\n\n<h5 class=\"wp-block-heading\">Liquid cooled External Load Rack<\/h5>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Management of very High Power tests: up to 8KW power dissipation<\/li>\n<\/ul>\n\n\n\n<h5 class=\"wp-block-heading\">Data Analysis SW Tool&nbsp;<\/h5>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Extended Data-Logging capability<\/li>\n\n\n\n<li>Real Time monitoring enabling Burn-in Adaptive Strategy&nbsp;<\/li>\n\n\n\n<li>Post processing analysis for feedback to R&amp;D, Product Quality and Reliability, Manufacturing&nbsp;<\/li>\n<\/ul>\n\n\n\n<h3 class=\"wp-block-heading\"><mark style=\"background-color:rgba(0, 0, 0, 0)\" class=\"has-inline-color has-accent-2-color\">Test platform main features<\/mark><\/h3>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Electrical Zones\/Chamber:<\/strong> Up to 6&nbsp;<\/li>\n\n\n\n<li><strong>DUT \/ Slot (Testing Capacity\/Chamber):<\/strong> Up to 20 (Up to 120)<\/li>\n\n\n\n<li><strong>Drain PSU Range:<\/strong> [0V to 1500V] (up to 200A\/slot)&nbsp;&nbsp;<\/li>\n\n\n\n<li><strong>Gate PSU Range:<\/strong> (- 15V <strong>\u2192<\/strong> 0) \/ (0 <strong>\u2192<\/strong> 35V). Configurable delta of 35V<\/li>\n\n\n\n<li><strong>Max Load Channels per Slot (Max Load Current per Slot):<\/strong> 20 (200A)<\/li>\n\n\n\n<li><strong>Maximum Frequency:<\/strong> 12.5 MHz<\/li>\n\n\n\n<li><strong>Digital Timing skew:<\/strong> 2ns<\/li>\n\n\n\n<li><strong>Load Channels (Load Current\/Channels):<\/strong> 20 (20A)<\/li>\n\n\n\n<li><strong>Load Dissipation\/Slot: <\/strong>Up to 8KW<\/li>\n\n\n\n<li><strong>DUT OFF State Measurement: <\/strong>IGSS, IDSS<\/li>\n\n\n\n<li><strong>DUT Parametric Measurement:<\/strong> Ron, Vth, Vsd<\/li>\n\n\n\n<li><strong>Dynamic RDSon Measurement:<\/strong> Yes, During Stress<\/li>\n\n\n\n<li><strong>Hard-Switching Methodology:<\/strong> Buck-Boost, Multi-Pulse, Soft\/Hard Mixing<\/li>\n<\/ul>\n\n\n\n<h5 class=\"wp-block-heading has-accent-1-color has-text-color has-link-color wp-elements-1\">Digital section main specifications<\/h5>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Number of drivers per pattern generator:<\/strong> 1<\/li>\n\n\n\n<li><strong>Number of signal lines:<\/strong> 336<\/li>\n\n\n\n<li><strong>Number of stimulus channels\/Number of I\/O Test Channels:<\/strong> 48\/288 (256 real time)<\/li>\n\n\n\n<li><strong>Power Supplies \u2013 DUT PSU<\/strong>: Up to 6<\/li>\n\n\n\n<li><strong>Power Supplies \u2013 Max Power per BIB\/Max Current per BIB:<\/strong> 600W\/104A (4x20A + 2x12A)<\/li>\n\n\n\n<li><strong>Vector RAM Size: <\/strong>1GB&nbsp;<\/li>\n<\/ul>\n\n\n\n<h3 class=\"wp-block-heading\"><mark style=\"background-color:rgba(0, 0, 0, 0)\" class=\"has-inline-color has-accent-2-color\">Thermal platform main features<\/mark><\/h3>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Number of Chambers\/Equipment:<\/strong> 2<\/li>\n\n\n\n<li><strong>BIB slots:<\/strong> 12 (6 for each chamber)<\/li>\n\n\n\n<li><strong>Max Temperature range:<\/strong> from -55\u00b0C up to 200\u00b0C<\/li>\n\n\n\n<li><strong>BIB insertion\/extraction:<\/strong> Automatic, at slot level<\/li>\n\n\n\n<li><strong>Chamber doors opening:<\/strong> Automatic. Sliding doors with inflatable gasket<\/li>\n\n\n\n<li><strong>Temperature Setting Resolution:<\/strong> 0,1\u00b0C<\/li>\n\n\n\n<li><strong>Temperature Setting Accuracy:<\/strong> \u00b11\u00b0C<\/li>\n\n\n\n<li><strong>Temperature Uniformity:<\/strong> \u00b13\u00b0C (<em>Valid in the range [-45; 150]\u00b0C @max. heat dissipation, with 12 Bibs loaded. Measurement points at 100 mm offset from chamber wall and 10 mm close to DUT)<\/em><\/li>\n\n\n\n<li><strong>Max Dissipation @150\u00b0C per Chamber:<\/strong> 5KW \/7,5 KW<\/li>\n\n\n\n<li><strong>Max Dissipation @-45\u00b0C per Chamber:<\/strong> 2,5KW \/ 3,5 KW<\/li>\n\n\n\n<li><strong>DUT Temperature Control: <\/strong>Independent Control per Single DUT (optional)<\/li>\n\n\n\n<li><strong>Condensation:<\/strong> Water<\/li>\n\n\n\n<li><strong>N2 Management Option:<\/strong> Available<\/li>\n<\/ul>\n\n\n\n<h3 class=\"wp-block-heading\"><mark style=\"background-color:rgba(0, 0, 0, 0)\" class=\"has-inline-color has-accent-2-color\">Software platform main features<\/mark><\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">The system&#8217;s Software Test Environment provides the complete set of tools for Test development (SW Development package), Production execution and Reporting (SW Execution package).&nbsp;<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">With its rich set of graphical user interface, the\u202fETNA Dynamic for DHTOL software offers the engineering tools necessary to characterize devices, as well as develop and debug test programs quickly and efficiently.&nbsp;<\/p>\n\n\n\n<h5 class=\"wp-block-heading\">Pattern Editor&nbsp;<\/h5>\n\n\n\n<ul class=\"wp-block-list\">\n<li>New IDE for pattern viewer and editor based on EDA platform vectors&nbsp;<\/li>\n\n\n\n<li>Easy Test program generation&nbsp;&nbsp;<\/li>\n<\/ul>\n\n\n\n<h5 class=\"wp-block-heading\">Test Plan Editor&nbsp;<\/h5>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Features for easier engineering activities&nbsp;<\/li>\n\n\n\n<li>Easier operator interface&nbsp;<\/li>\n<\/ul>\n\n\n\n<h5 class=\"wp-block-heading\">Data Viewer&nbsp;&nbsp;<\/h5>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Powerful data reporting and analysis, which includes dedicated Burn-in data format and STDF output&nbsp;<\/li>\n\n\n\n<li>Run-time access to test-flow steps, parameters and measures\u00a0<\/li>\n\n\n\n<li>Detailed report on the analyzed data&nbsp;<\/li>\n<\/ul>\n\n\n\n<h3 class=\"wp-block-heading has-accent-2-color has-text-color has-link-color wp-elements-2\"><mark style=\"background-color:rgba(0, 0, 0, 0)\" class=\"has-inline-color has-accent-2-color\">Contact us<\/mark><\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">In addition to the significant existing products&#8217; portfolio, EDA Industries is specialized in meeting specific customer requests by customizing its solutions or by designing new ones.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">For further info, please send a direct request to <a href=\"mailto:sales@eda-industries.com\">sales@eda-industries.com<\/a><\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><\/p>\n","protected":false},"excerpt":{"rendered":"<p>The ETNA Dynamic DHTOL Solution allows the Customer to speed up the reliability assessment of GaN devices, supporting their successful introduction in technologically advanced fields: from Automotive to Industrial as well as TLC and Aerospace ones.<\/p>\n","protected":false},"featured_media":2285,"template":"","meta":{"inline_featured_image":false,"advanced_seo_description":"","jetpack_seo_html_title":"","jetpack_seo_noindex":false,"jetpack_seo_schema_type":""},"product_categories":[15],"product_tags":[17,18],"class_list":["post-1805","products","type-products","status-publish","has-post-thumbnail","hentry","product_categories-burn-in-reliability-equipment","product_tags-sic-gan","product_tags-power-modules"],"jetpack_sharing_enabled":true,"_links":{"self":[{"href":"https:\/\/www.eda-industries.net\/en\/wp-json\/wp\/v2\/products\/1805","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.eda-industries.net\/en\/wp-json\/wp\/v2\/products"}],"about":[{"href":"https:\/\/www.eda-industries.net\/en\/wp-json\/wp\/v2\/types\/products"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.eda-industries.net\/en\/wp-json\/wp\/v2\/media\/2285"}],"wp:attachment":[{"href":"https:\/\/www.eda-industries.net\/en\/wp-json\/wp\/v2\/media?parent=1805"}],"wp:term":[{"taxonomy":"product_categories","embeddable":true,"href":"https:\/\/www.eda-industries.net\/en\/wp-json\/wp\/v2\/product_categories?post=1805"},{"taxonomy":"product_tags","embeddable":true,"href":"https:\/\/www.eda-industries.net\/en\/wp-json\/wp\/v2\/product_tags?post=1805"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}