Test Electronic for Burn-in System

UBTS / VBTS / VBTS-M Series

Starting with dedicated BI system for Memories, Digital, Automotive and Mixed-Signal devices, the technological evolution of devices dictated from the market and the demand of increasing the test capacity have brought EDA Industries to design a powerful and innovative test system: the UBTS - Universal Burnin Test System.

This series is based on reprogrammable Microprocessor and FPGA firmwares, so that the same HW platform can be SW reconfigured as a Digital, Mixed-Signal, Memory tester.
Moreover, it allows a continuous development of new features and upgrades, that can be easily released/updated just by deploying a FW release.

EDA has continuously developed its main BurnIn systems introducing many features and improving roboustness in order to offer a state-of-art Test Electronic for the BurnIn.
Driving the evolution since UBTS, through VBTS, and finally to its latest modular version: the VBTS-M.

Main Features:

    • advanced modularity for an easy system configuration and improved maintenability
    • up to 256 I/O Bidirectional lines
    • up to 48 Stimulation lines
    • additional 32 Input lines
    • up to 6 DUTs Power Supply Units, powering each BIB with up to 600W and 104A.
    • 4 VREF for DUT Voltage References
    • 32 EXT lines for optional boards, ensuring function expandability and customization.

Options:

    • Analog Waveform Generator board, adding 4 differential Analog channels. 
    • Analog Monitoring board, replacing 128 IOs with 96 Analog Input lines, monitored by windows comparation. 
    • High Power option, bringing additional 16 High Power Supplies dedicated for DUTs' supply, powering each BIB with more than 2KW and 640A.
    • DUT TEMP MON option for Single Device Temperature Monitoring, fully embedded in the EDA system.
    • Single-Device Temperature Control option, fully embedded in the EDA system.
    • Parametric Measurement option, adding PMU capability to every line and power supply.
    • Enhanced option for advanced Quality and Reliability Test, bringing arbitrary waveform generation, advanced analog monitoring, and a 5KW external power supply control with 24 EXT-PSU lines for independent voltage and current monitoring.
    • Enhanced option for Power/Load architecture, bringing an additional 5/10KW External Power Supply to dest devices that requires external fixed or programmable load.

Compatibility:

    • to replace the existing systems with the new platform while keeping in use the existing BIBs VBTS-M Series ensures the compatibility with
      • the other EDA BIB standards: DBTS, HBTS, MBTSII, MBTSIII, ARES
      • many non-EDA BIB standard: Standard-A, Standard-C, AHER-MAX,  ART-200, UAMT, ADBV1, EJ18/EJ22, ENDZONE, CRITERIA.
    • ... ask us to make your BIB standard compatibile with the state-of-the-art EDA BurnIn platform...

 

DFTB Series

Under construction...

 

MBTSIII Series

Under construction...

 

DBTS / DBTS-LV / DBTS-A / HBTS / MBTS

They are our original solution for Digital, Hybrid, Automotive and Memory devices.
Now covered by our Universal BurnIn and Test platform: the newest VBTS-M series.

 

 

For info, pls send a direct request to This email address is being protected from spambots. You need JavaScript enabled to view it..

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